Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method

SURFACE AND INTERFACE ANALYSIS

Polcak, J; Cechal, J; Babor, P; Urbanek, M; Prusa, S; Sikola, T, 2010: Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method. SURFACE AND INTERFACE ANALYSIS 42(41826), p. 649 - 652, doi: 10.1002/sia.3361

Výzkumné skupiny:

Příprava a charakterizace nanostruktur

CEITEC autoři:

Ing. Michal Urbánek, Ph.D.
doc. Ing. Stanislav Průša, Ph.D.
prof. RNDr. Tomáš Šikola, CSc.