Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

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Guarantor: Ing. Ondřej Man, Ph.D.
Instrument status: Operational Operational, 17.10.2024 12:30
Equipment placement: CEITEC Nano - A1.10
Výzkumná skupina: CF: CEITEC Nano


Popis:

Rastrovací elektronový mikroskop se zdrojem elektronů typu FEG a proměnným vakuem, s rozlišením alespoň 1,5 nm @ 15 kV (za vysokého vakua) a komorou umožňující posuv stolku XY alespoň 100 x 100 mm. Vybaven analytickými systémy EDS + WDS + EBSD.


Publications:

  • Tichý, M., 2024: In-situ analysis of magnetic phase transition in FeRh using transmission electron microscopy. BACHELOR´S THESIS , p. 1 - 48; FULL TEXT
    (VERSALAB, HELIOS, TITAN)
  • Štindl, J., 2024: Correlative imaging of magnetic order in antiferromagnets. BACHELOR´S THESIS , p. 1 - 44; FULL TEXT
    (VERSALAB, KERR-MICROSCOPE, HELIOS, SAW-ACCUTOM, US-CUTTER, TITAN)
  • Gazdík, R., 2024: Defect localization and analysis in GaN. MASTER´S THESIS , p. 1 - 66; FULL TEXT
    (MIRA-STAN, HELIOS, TITAN)
  • Karpinski, D.; Polcar, T.; Bondarev, A., 2024: Exploring nanoscale metallic multilayer Ta/Cu films: Structure and some insights on deformation and strengthening mechanisms. MATERIALS CHARACTERIZATION 212, doi: 10.1016/j.matchar.2024.113933; FULL TEXT
    (TITAN, VERIOS, HELIOS)
  • PONGRÁCZ, J.; VACEK, P.; GRÖGER, R., 2023: Recombination activity of threading dislocations in MOVPE-grown AlN/Si {111} films etched by phosphoric acid. JOURNAL OF APPLIED PHYSICS 134(19), doi: 10.1063/5.0171937; FULL TEXT
    (LYRA, ICON-SPM, HELIOS, TITAN, LEICACOAT-NANO)

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