Mechanical profilometer Bruker Dektak XT (DEKTAK)

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Guarantor: Ing. Radim Zahradníček, Ph.D.
Technologie / Metodologie: Nanolitography infrastructure
Instrument status: Operational Operational, 9.10.2023 13:11
Equipment placement: CEITEC Nano - C1.30
Výzkumná skupina: CF: CEITEC Nano


Popis:

The DektakXT® stylus surface profiler is an advanced thin and thick film step height measurement tool. In addition to profiling surface topography and waviness, the DektakXT system measures roughness in the nanometer range. Available with a standard manual sample-positioning stage or an optional automatic X-Y or theta stage, it provides step-height repeatability of 5Å (<0.6 nm).
In addition to taking two-dimensional surface profile measurements, the DektakXT system can produce three-dimensional measurements and analyses when equipped with the 3D Mapping Option. With the N-Lite+ Option, it can allow low-force stylus engagement and scanning, optimized to protect force-sensitive samples.


Publications:

  • RONOH, K.; NOVOTNÝ, J.; MRŇA, L.; KNÁPEK, A.; SOBOLA, D., 2024: Analysis of processing efficiency, surface, and bulk chemistry, and nanomechanical properties of the Monel® alloy 400 after ultrashort pulsed laser ablation. MATERIALS RESEARCH EXPRESS 11(1), doi: 10.1088/2053-1591/ad184b; FULL TEXT
    (DEKTAK, MIRA-STAN, KRATOS-XPS, NANOINDENTER)
  • RONOH, K.; NOVOTNÝ, J.; MRŇA, L.; KNÁPEK, A.; SOBOLA, D., 2024: Effects of laser and scanning parameters on surface modification of MONEL ® alloy 400 by picosecond laser . OPTICS AND LASER TECHNOLOGY 172, p. 1 - 19, doi: 10.1016/j.optlastec.2023.110514; FULL TEXT
    (TEGRAMIN, VERIOS, DEKTAK)
  • RONOH, K.; NOVOTNÝ, J.; MRŇA, L.; KNÁPEK, A.; SOBOLA, D., 2024: Surface Structuring of the CP Titanium by Ultrafast Laser Pulses. MATERIALS RESEARCH EXPRESS 14(8), p. 1 - 21, doi: 10.3390/app14083164; FULL TEXT
    (MIRA-STAN, WITEC-RAMAN, SEE-SYSTEM, DEKTAK)
  • Mouralova, K.; Benes, L.; Fries, J., 2024: Comparison of MRR of different WEDM-machined materials. THE INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY 132(9-10), p. 4461 - 4471, doi: 10.1007/s00170-024-13631-7; FULL TEXT
    (TEGRAMIN, LYRA, DEKTAK)
  • GALLINA, P.; KVAPIL, M.; LIŠKA, J.; KONEČNÁ, A.; KŘÁPEK, V.; KALOUSEK, R.; ZLÁMAL, J.; ŠIKOLA, T., 2023: Strong coupling in an Au plasmonic antenna-SiO2 layer system: A hybrid-mode analysis. PHYSICAL REVIEW B 107(12), p. 125144 - 6, doi: 10.1103/PhysRevB.107.125144; FULL TEXT
    (ALD, EVAPORATOR, MIRA-EBL, FTIR, NANOCALC, DEKTAK, WOOLLAM-MIR, ICON-SPM)

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