MIR spectroscopic ellipsometer J. A. Woollam IR-VASE (WOOLLAM-MIR)

MIR spectroscopic ellipsometer J. A. Woollam IR-VASE

Technologie / Metodologie: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Equipment placement: CEITEC Nano - C1.21
Výzkumná skupina: CF: CEITEC Nano


Popis:

měření optických vlastností


Publications:

  • Grümbel, J.; Goldhahn, R.; Feneberg, M.; Oshima, Y.; Dubroka, A.; Ramsteiner, M., 2024: Band gaps and phonons of quasi-bulk rocksalt ScN. PHYSICAL REVIEW MATERIALS 8(7), doi: 10.1103/PhysRevMaterials.8.L071601; FULL TEXT
    (WOOLLAM-MIR, WOOLLAM-VIS, FTIR)
  • GALLINA, P.; KVAPIL, M.; LIŠKA, J.; KONEČNÁ, A.; KŘÁPEK, V.; KALOUSEK, R.; ZLÁMAL, J.; ŠIKOLA, T., 2023: Strong coupling in an Au plasmonic antenna-SiO2 layer system: A hybrid-mode analysis. PHYSICAL REVIEW B 107(12), p. 125144 - 6, doi: 10.1103/PhysRevB.107.125144; FULL TEXT
    (ALD, EVAPORATOR, MIRA-EBL, FTIR, NANOCALC, DEKTAK, WOOLLAM-MIR, ICON-SPM)
  • Duchaň; M., 2023: Study of optical response of ferromagnetic manganese oxides. BACHELOR´S THESIS , p. 1 - 31; FULL TEXT
    (WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9)
  • Kelarová, Š., 2023: Organosilicon coatings based on trimethylsilyl acetate monomer prepared using plasma of RF capacitively coupled glow discharge. PH.D. THESIS , p. 1 - 182; FULL TEXT
    (WOOLLAM-MIR, FTIR, KRATOS-XPS, SIMS)
  • Hale, N.; Hartl, M.; Humlicek, J.; Brüne, C.; Kildemo, M., 2023: Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry. OPTICAL MATERIALS EXPRESS 13(7), p. 2020 - 16, doi: 10.1364/OME.493426; FULL TEXT
    (WOOLLAM-MIR, WOOLLAM-VIS)

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