Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)
CONTACT US
Guarantor:
Ing. Petr Bábor, Ph.D.
Technologie / Metodologie:
In situ fabrication & Characterization
Instrument status:
Operational, 5.3.2024 14:20, successful installation.
Equipment placement:
CEITEC Nano - C1.38
Výzkumná skupina:
CF: CEITEC Nano
Popis:
Hmotnostní spektroskopie sekundárních iontů
Publications:
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Kelarová, Š., 2023: Organosilicon coatings based on trimethylsilyl acetate monomer prepared using plasma of RF capacitively coupled glow discharge. PH.D. THESIS , p. 1 - 182; FULL TEXT
(WOOLLAM-MIR, FTIR, KRATOS-XPS, SIMS)
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SALAMON, D.; BUKVIŠOVÁ, K.; JAN, V.; POTOČEK, M.; ČECHAL, J., 2023: Superflux of an organic adlayer towards its local reactive immobilization. COMMUNICATIONS CHEMISTRY 6(1), doi: 10.1038/s42004-023-01020-2; FULL TEXT
(KRATOS-XPS, SIMS, LYRA, LITESCOPE-LYRA)
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Sen, HS.; Daghbouj, N.; Callisti, M.; Vronka, M.; Karlik, M.; Duchon, J.; Cech, J.; Lorincik, J.; Havranek, V.; Babor, P.; Polcar, T., 2022: Interface-Driven Strain in Heavy Ion-Irradiated Zr/Nb Nanoscale Metallic Multilayers: Validation of Distortion Modeling via Local Strain Mapping. ACS APPLIED MATERIALS & INTERFACES 14(10), p. 12777 - 20, doi: 10.1021/acsami.1c22995; FULL TEXT
(SIMS)
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MACKOVÁ, A.; FERNANDES, S.; MATĚJÍČEK, J.; VILÉMOVÁ, M.; HOLÝ, V.; LIEDKE, M.O.; MARTAN, J.; VRONKA, M.; POTOČEK, M.; BÁBOR, P.; BUTTERLING, M.; ATTALLAH, A.G.; HIRSCHMANN, E.; WAGNER, A.; HAVRANEK, V., 2021: Radiation damage evolution in pure W and W-Cr-Hf alloy caused by 5 MeV Au ions in a broad range of dpa. NUCLEAR MATERIALS AND ENERGY 29, p. 101085-1 - 15, doi: 10.1016/j.nme.2021.101085; FULL TEXT
(SIMS)
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Ramazanov, S.; Sobola, D.; Ţălu, Ş.; Orudzev, F.; Arman, A.; Kaspar, P.; Dallaev, R.; Ramazanov, G., 2021: Multiferroic behavior of the functionalized surface of a flexible substrate by deposition of Bi2O3 and Fe2O3. MICROSCOPY RESEARCH AND TECHNIQUE , p. 1 - 11, doi: 10.1002/jemt.23996; FULL TEXT
(SIMS, KRATOS-XPS, CRYOGENIC, VERIOS, LYRA)
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UKRAINTSEV, E.; KROMKA, A.; JANSSEN, W.; HAENEN, K.; TAKEUCHI, D.; BÁBOR, P.; REZEK, B., 2021: Electron emission from H-terminated diamond enhanced by polypyrrole grafting. CARBON 176, p. 642 - 8, doi: 10.1016/j.carbon.2020.12.043; FULL TEXT
(SIMS, NANOSAM)
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Liška, P., 2021: Optical characterization of advanced nanomaterials with a high lateral resolution. MASTER´S THESIS , p. 1 - 91; FULL TEXT
(NANOSAM, SNOM-NANONICS, ICON-SPM, LYRA, TITAN, VERIOS, WITEC-RAMAN, KRATOS-XPS, SIMS)
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DAGHBOUJ, N.; CALLISTI, M.; SEN, H. S.; KARLIK, M.; ČECH, J.; VRONKA, M.; HAVRÁNEK, V.; ČAPEK, J.; MINÁRIK, P.; BÁBOR, P.; POLCAR, T., 2021: Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers. ACTA MATERIALIA 202, p. 317 - 14, doi: 10.1016/j.actamat.2020.10.072; FULL TEXT
(SIMS)
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PAPEŽ, N.; DALLAEV, R.; KASPAR, P.; SOBOLA, D.; ŠKARVADA, P.; ŢĂLU, Ş.; RAMAZANOV, S.; NEBOJSA, A., 2021: Characterization of GaAs Solar Cells under Supercontinuum Long-Time Illumination . MATERIALS 14(2), p. 1 - 13, doi: 10.3390/ma14020461; FULL TEXT
(JAZ3-CHANNEL, KRATOS-XPS, WITEC-RAMAN, SIMS)
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VANĚK, T., HÁJEK, F., DOMINEC, F., HUBÁČEK, T., KULDOVÁ, K., PANGRÁC, J., KOŠUTOVÁ, T., KEJZLAR, P., BÁBOR, P., LACHOWSKI, A., HOSPODKOVÁ, A., 2021: Luminescence redshift of thick InGaN/GaN heterostructures induced by the migration of surface adsorbed atoms. JOURNAL OF CRYSTAL GROWTH 565, p. 126151 - 6, doi: 10.1016/j.jcrysgro.2021.126151; FULL TEXT
(SIMS)
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Rejhon, M.; Brynza, M.; Grill, R.; Belas, E.; Kunc, J., 2021: Investigation of deep levels in semi-insulating vanadium-doped 4H-SiC by photocurrent spectroscopy. PHYSICS LETTERS A 405, doi: 10.1016/j.physleta.2021.127433; FULL TEXT
(FTIR-CHEMLAB, SIMS)
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Dallaev, R., 2021: Investigation of hydrogen impurities in PE-ALD AlN thin films by IBA methods. VACUUM 193, doi: 10.1016/j.vacuum.2021.110533; FULL TEXT
(ALD, SIMS, ICON-SPM)
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RAMAZANOV, S.; SOBOLA, D.; ORUDZHEV, F.; KNÁPEK, A.; POLČÁK, J.; POTOČEK, M.; KASPAR, P.; DALLAEV, R., 2020: Surface Modification and Enhancement of Ferromagnetism in BiFeO3 Nanofilms Deposited on HOPG. NANOMATERIALS 10(10), p. 1990-1 - 17, doi: 10.3390/nano10101990; FULL TEXT
(HELIOS, SIMS, KRATOS-XPS, CRYOGENIC)
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Dallaev, R; Sobola, D; Tofel, P; Skvarenina, L; Sedlak, P, 2020: Aluminum Nitride Nanofilms by Atomic Layer Deposition Using Alternative Precursors Hydrazinium Chloride and Triisobutylaluminum. COATINGS, MDPI 10(10), p. 954-1 - 954-14, doi: 10.3390/coatings10100954
(KRATOS-XPS, SIMS, ICON-SPM)
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Číž, T., 2020: X-ray diffraction analysis of oxide layers. MASTER´S THESIS
(KRATOS-XPS, WOOLLAM-VIS, RIGAKU9, SIMS)
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Papez, N; Gajdos, A; Sobola, D; Dallaev, R; Macku, R; Skarvada, P; Grmela, L, 2020: Effect of gamma radiation on properties and performance of GaAs based solar cells. APPLIED SURFACE SCIENCE 527, p. 146766-1 - 146766-11, doi: 10.1016/j.apsusc.2020.146766
(WOOLLAM-VIS, SIMS, FTIR, WITEC-RAMAN, LYRA)
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ŠETKA, M.; BAHOS, F.; MATATAGUI, D.; POTOČEK, M.; KRÁL, Z.; DRBOHLAVOVÁ, J.; GRÁCIA, I.; VALLEJOS VARGAS, S., 2020: Love wave sensors based on gold nanoparticle-modified polypyrrole and their properties to ammonia and ethylene. SENSORS AND ACTUATORS B: CHEMICAL 304, p. 1 - 10, doi: 10.1016/j.snb.2019.127337; FULL TEXT
(TITAN, SIMS, HELIOS, ICON-SPM)
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Papež, N.; Gajdoš, A.; Dallaev, R.; Sobola, D.; Sedlák, P.; Motúz, R.; Nebojsa, A.; Grmela, L., 2020: Performance analysis of GaAs based solar cells under gamma irradiation. APPLIED SURFACE SCIENCE 510, p. 145329-1 - 145329-8, doi: 10.1016/j.apsusc.2020.145329
(WITEC-RAMAN, HELIOS, SIMS)
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UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F., 2020: Single-layer graphene on epitaxial FeRh thin films. APPLIED SURFACE SCIENCE 514, p. 145923-1 - 7, doi: 10.1016/j.apsusc.2020.145923; FULL TEXT
(MAGNETRON, VERSALAB, RIGAKU9, UHV-LEEM, UHV-LEIS, UHV-SPM, UHV-PREPARATION, UHV-XPS, SIMS)
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SOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M., 2020: Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate. MATERIALS 13(10), p. 1 - 15, doi: 10.3390/ma13102402; FULL TEXT
(SIMS, WITEC-RAMAN, LITESCOPE-LYRA, KRATOS-XPS, LYRA)
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HOLEŇÁK, R.; SPUSTA, T.; POTOČEK, M.; SALAMON, D.; ŠIKOLA, T.; BÁBOR, P., 2019: 3D localization of spinel (MgAl2O4) and sodium contamination in alumina by TOF-SIMS. MATERIALS CHARACTERIZATION 148, p. 252 - 7, doi: 10.1016/j.matchar.2018.12.019; FULL TEXT
(SIMS, VERIOS)
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Kunc, J.; Rejhon, M.; Dědič, V.; Bábor, P., 2019: Thickness of sublimation grown SiC layers measured by scanning Raman spectroscopy. JOURNAL OF ALLOYS AND COMPOUNDS 789, p. 607 - 612, doi: 10.1016/j.jallcom.2019.02.305
(DEKTAK, SIMS)
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DRDLÍK, D.; ROLEČEK, J.; DRDLÍKOVÁ, K.; SALAMON, D., 2018: Restraining of calcium contamination in near-net shape alumina ceramics during slip casting. INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY 15(6), p. 1559 - 8, doi: 10.1111/ijac.13042; FULL TEXT
(SIMS, LYRA)
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JIANG, L.; XIAO, N.; WANG, B.; GRUSTAN-GUTIERREZ, E.; JING, X.; BÁBOR, P.; KOLÍBAL, M.; LU, G.; WU, T.; WANG, H.; HUI, F.; SHI, Y.; SONG, B.; XIE, X.; LANZA, M., 2017: High-resolution characterization of hexagonal boron nitride coatings exposed to aqueous and air oxidative environments. NANO RESEARCH 10(6), p. 2046 - 10, doi: 10.1007/s12274-016-1393-2; FULL TEXT
(NANOSAM, SIMS)
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