Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)

CONTACT US

Guarantor: Ing. Petr Bábor, Ph.D.
Technologie / Metodologie: In situ fabrication & Characterization
Instrument status: Operational Operational, 5.3.2024 14:20, successful installation.
Equipment placement: CEITEC Nano - C1.38
Výzkumná skupina: CF: CEITEC Nano


Popis:

Hmotnostní spektroskopie sekundárních iontů


Publications:

  • Kelarová, Š., 2023: Organosilicon coatings based on trimethylsilyl acetate monomer prepared using plasma of RF capacitively coupled glow discharge. PH.D. THESIS , p. 1 - 182; FULL TEXT
    (WOOLLAM-MIR, FTIR, KRATOS-XPS, SIMS)
  • SALAMON, D.; BUKVIŠOVÁ, K.; JAN, V.; POTOČEK, M.; ČECHAL, J., 2023: Superflux of an organic adlayer towards its local reactive immobilization. COMMUNICATIONS CHEMISTRY 6(1), doi: 10.1038/s42004-023-01020-2; FULL TEXT
    (KRATOS-XPS, SIMS, LYRA, LITESCOPE-LYRA)
  • Sen, HS.; Daghbouj, N.; Callisti, M.; Vronka, M.; Karlik, M.; Duchon, J.; Cech, J.; Lorincik, J.; Havranek, V.; Babor, P.; Polcar, T., 2022: Interface-Driven Strain in Heavy Ion-Irradiated Zr/Nb Nanoscale Metallic Multilayers: Validation of Distortion Modeling via Local Strain Mapping. ACS APPLIED MATERIALS & INTERFACES 14(10), p. 12777 - 20, doi: 10.1021/acsami.1c22995; FULL TEXT
    (SIMS)
  • UKRAINTSEV, E.; KROMKA, A.; JANSSEN, W.; HAENEN, K.; TAKEUCHI, D.; BÁBOR, P.; REZEK, B., 2021: Electron emission from H-terminated diamond enhanced by polypyrrole grafting. CARBON 176, p. 642 - 8, doi: 10.1016/j.carbon.2020.12.043; FULL TEXT
    (SIMS, NANOSAM)
  • Liška, P., 2021: Optical characterization of advanced nanomaterials with a high lateral resolution. MASTER´S THESIS , p. 1 - 91; FULL TEXT
    (NANOSAM, SNOM-NANONICS, ICON-SPM, LYRA, TITAN, VERIOS, WITEC-RAMAN, KRATOS-XPS, SIMS)

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